{"id":2053,"date":"2024-12-26T11:00:13","date_gmt":"2024-12-26T03:00:13","guid":{"rendered":"https:\/\/www.tpt.com.tw\/?page_id=2053"},"modified":"2025-11-10T14:06:04","modified_gmt":"2025-11-10T06:06:04","slug":"%e6%99%ae%e8%b3%bd%e6%96%af%e8%a8%ad%e5%82%99%e9%82%8a%e5%b0%84%e5%9e%8b%e6%99%b6%e7%b2%92%e9%bb%9e%e6%b8%ac%e5%88%86%e9%81%b8%e6%a9%9f","status":"publish","type":"page","link":"https:\/\/www.tpt.com.tw\/en\/%e4%bb%a3%e7%90%86%e7%94%a2%e5%93%81\/%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99\/%e6%99%ae%e8%b3%bd%e6%96%af%e8%a8%ad%e5%82%99%e9%82%8a%e5%b0%84%e5%9e%8b%e6%99%b6%e7%b2%92%e9%bb%9e%e6%b8%ac%e5%88%86%e9%81%b8%e6%a9%9f\/","title":{"rendered":"PRECISE\uff5cAutomation Equipment\uff5cLaser Chip Testing and Sorting System"},"content":{"rendered":"
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100ns Pulse Bar Tester<\/p>\n<\/div>\n<\/div>\n\n\n\n

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Laser Chip Testing and Sorting System<\/strong><\/p>\n<\/div>\n<\/div>\n\n\n\n

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VCSEL Wafer Tester<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n

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\u666e\u8cfd\u65af(PREISE) \/ CHIP25401<\/strong><\/strong><\/h6>\n\n\n\n

Laser Chip Testing and Sorting System<\/p>\n<\/div>\n\n\n\n

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CHIP25401 applies to wafer normal temperature\/high temperature PIV and spectral tests, and classifies the different test results.<\/p>\n\n\n\n

The testing stage can be translated and rotated to support tiled cavity chip testing. It supports integrating sphere, large area PD, collimated coupling, and horizontal\/vertical far field pattern testing.<\/p>\n\n\n\n

Far field patter testing: supports both for horizontal and vertical direction swing-arm scanning, and accuracy within 0.1\u00b0.<\/p>\n\n\n\n

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Specification<\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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