{"id":2145,"date":"2024-12-27T11:00:21","date_gmt":"2024-12-27T03:00:21","guid":{"rendered":"https:\/\/www.tpt.com.tw\/?page_id=2145"},"modified":"2025-11-10T13:58:52","modified_gmt":"2025-11-10T05:58:52","slug":"%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%a8%ad%e5%82%99%ef%bd%9c100ns-%e8%84%88%e8%a1%9dbar%e6%a2%9d%e6%b8%ac%e8%a9%a6%e6%a9%9f","status":"publish","type":"page","link":"https:\/\/www.tpt.com.tw\/en\/%e4%bb%a3%e7%90%86%e7%94%a2%e5%93%81\/%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99\/%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%a8%ad%e5%82%99%ef%bd%9c100ns-%e8%84%88%e8%a1%9dbar%e6%a2%9d%e6%b8%ac%e8%a9%a6%e6%a9%9f\/","title":{"rendered":"PRECISE\uff5cAutomation Equipment\uff5c100ns Pulse Bar Tester"},"content":{"rendered":"
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100ns Pulse Bar Tester<\/strong><\/p>\n<\/div>\n<\/div>\n\n\n\n

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Laser Chip Testing and Sorting System<\/p>\n<\/div>\n<\/div>\n\n\n\n

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VCSEL Wafer Tester<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n

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\u666e\u8cfd\u65af(PREISE) \/ BarT-HP<\/strong><\/strong><\/h6>\n\n\n\n

100ns Pulse Bar Tester<\/strong><\/p>\n<\/div>\n\n\n\n

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For Lidar application, such as laser chips, industrial-grade high-power laser chips, medical and display and other high-power laser chip fields.<\/p>\n\n\n\n

It supports high current, ns-level short pulse condition testing, and fully automatic testing of BAR bar LIV curves, spectrum and far-field parameters. Also support variable temperature testing.<\/p>\n\n\n\n

Fully automatic load\/unload; It supports loading of various specifications of material boxes and unloading of various specifications of material boxes or blue tape.<\/p>\n<\/div>\n<\/div>\n\n\n\n

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