{"id":4129,"date":"2025-10-27T17:19:56","date_gmt":"2025-10-27T09:19:56","guid":{"rendered":"https:\/\/www.tpt.com.tw\/?page_id=4129"},"modified":"2025-11-10T13:55:05","modified_gmt":"2025-11-10T05:55:05","slug":"%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99%ef%bd%9ccoc%e4%b8%89%e6%ba%ab%e6%b8%ac%e8%a9%a6%e6%a9%9f","status":"publish","type":"page","link":"https:\/\/www.tpt.com.tw\/en\/%e4%bb%a3%e7%90%86%e7%94%a2%e5%93%81\/%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99\/%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99%ef%bd%9ccoc%e4%b8%89%e6%ba%ab%e6%b8%ac%e8%a9%a6%e6%a9%9f\/","title":{"rendered":"PRECISE\uff5cAutomation Equipment\uff5cCOC Three-Temperature Tester"},"content":{"rendered":"
\n
\n
\u666e\u8cfd\u65af(PRECISE) \/ PSS COC3T19201<\/strong><\/h6>\n\n\n\n

COC Fully Automatic Three-Temperature Tester<\/strong><\/p>\n<\/div>\n\n\n\n

<\/div>\n\n\n\n
\n
\n
\n

This system is designed for COC \/ COS packaged DFB, EML, and SOA chips, performing comprehensive LIV and optical spectrum testing under low, room, and high temperature conditions.\nIt supports \u03bcs-level DC\/pulse output and measurement, features a dual-test-station design, and is equipped with a fully automated handling mechanism.<\/p>\n\n\n\n

With high integration, high testing efficiency, and stability, as well as easy operation and maintenance, it is particularly suitable for\uff1a\n\nResearch and analysis of optoelectronic performance characteristics\uff1b\nMass production testing of DFB, EML, and SOA chips in COC \/ COS packaging<\/p>\n\n\n\n

<\/div>\n\n\n\n
\n
Specification<\/a><\/div>\n<\/div>\n<\/div>\n\n\n\n
\n
\"\"<\/figure>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
<\/div>\n\n\n\n

Features<\/strong><\/h2>\n\n\n\n