{"id":737,"date":"2025-10-27T11:00:00","date_gmt":"2025-10-27T03:00:00","guid":{"rendered":"https:\/\/www.tpt.com.tw\/?page_id=737"},"modified":"2025-11-10T13:59:28","modified_gmt":"2025-11-10T05:59:28","slug":"%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%a8%ad%e5%82%99%ef%bd%9ccoc%e6%8a%bd%e5%b1%9c%e5%bc%8f%e8%80%81%e5%8c%96%e7%b3%bb%e7%b5%b1","status":"publish","type":"page","link":"https:\/\/www.tpt.com.tw\/en\/%e4%bb%a3%e7%90%86%e7%94%a2%e5%93%81\/%e8%87%aa%e5%8b%95%e5%8c%96%e8%a8%ad%e5%82%99\/%e6%99%ae%e8%b3%bd%e6%96%af%ef%bd%9c%e8%a8%ad%e5%82%99%ef%bd%9ccoc%e6%8a%bd%e5%b1%9c%e5%bc%8f%e8%80%81%e5%8c%96%e7%b3%bb%e7%b5%b1\/","title":{"rendered":"PRECISE\uff5cAutomation Equipment\uff5cCOC Burn-in System"},"content":{"rendered":"
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High Power TO Burn-in Tester<\/a><\/div>\n\n\n\n
COC Burn-in Tester<\/a><\/div>\n\n\n\n
Short Pulse TO Burn-in Tester<\/a><\/div>\n\n\n\n
Optical Module Burn-in Tester<\/a><\/div>\n<\/div>\n\n\n\n
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\u666e\u8cfd\u65af(PRECISE) \/ PSS COC BI Series (LRS23841<\/strong>)<\/strong><\/h6>\n\n\n\n

High-Power Drawer-Type COC Burn-In System<\/p>\n<\/div>\n\n\n\n

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Designed for high-power DFB, EML, and EML-SOA chips, this system performs aging screening and lifetime reliability analysis.\nIt supports constant-current (LD & SOA) and constant-voltage (EA) synchronous output, allowing real-time monitoring of current, voltage, optical power, and temperature, with automatic determination of device failure status.\nData can be stored locally or remotely, enabling failure analysis and traceability.<\/p>\n\n\n\n

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Specification<\/a><\/div>\n<\/div>\n<\/div>\n\n\n\n
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\"PSS<\/figure>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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Features<\/strong><\/h2>\n\n\n\n