普賽斯(PRECISE) / PSS COC3T19201
COC Fully Automatic Three-Temperature Tester
This system is designed for COC / COS packaged DFB, EML, and SOA chips, performing comprehensive LIV and optical spectrum testing under low, room, and high temperature conditions. It supports μs-level DC/pulse output and measurement, features a dual-test-station design, and is equipped with a fully automated handling mechanism.
With high integration, high testing efficiency, and stability, as well as easy operation and maintenance, it is particularly suitable for： Research and analysis of optoelectronic performance characteristics； Mass production testing of DFB, EML, and SOA chips in COC / COS packaging
Features
- Dual-test-station design with independent temperature control for improved testing efficiency.
- Automated handling via robotic arm, reducing manual operation and enhancing reliability.
- Wide temperature control range: –10 to 90℃, supporting COC three-temperature performance testing.
- High measurement repeatability: Threshold current (Ith) and output power (Po) repeatability < ±1%; wavelength repeatability < ±0.15 dB.
- Self-developed test instruments to prevent EOS (Electrical Overstress) during testing.
- Optical coupling and receiving system professionally designed for enhanced coupling efficiency and measurement consistency.
- Semi-customizable software adaptable to client-specific production processes.
Technical specification
Item Specification LD Drive Current 0~1A, Accuracy 0.1%rdg±2mA LD Forward Voltage 0~6V, Accuracy 0.1%rdg ± 6mV, Supports four-wire measurement LD Drive Current Detection 0~1A, Accuracy 0.1%rdg±2mA LD Power Mode Pulse and DC LD Reverse Voltage Test 0~30V, Accuracy 0.1%rdg±0.03V LD Reverse Current 2~20μA, Accuracy 0.1%rdg±1μA Pulse Width 100us~500ms Forward Optical Power Detection 0.4mW~300mW，0.5%rdg±0.2mW Wavelength 800～1700nm Temperature Range -5℃~85℃ Temperature stability ±0.5℃ Temperature Uniformity ±1℃
Software System
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